UNIFORMITY TESTING SYSTEM AND METHODOLOGY FOR UTILIZING THE SAME

摘要

A system (10) for testing an implement (W, T, TWNI, TWI) is disclosed. The system (10) includes: a computing resource (12), an implement rotating device (14), a light emitting device (16) and a light receiving device (18). The implement rotating device (14) rotatably-supports the implement (W, T, TWNI, TWI). The implement rotating device (14) is communicatively-coupled to the computing resource (12). The light emitting device (16) is communicatively-coupled to the computing resource (12). The light receiving device (18) is communicatively-coupled to the computing resource (12). The implement rotating device (14) and the implement (W, T, TWNI, TWI) are arranged between the light emitting device (16) and the light receiving device (18). The light emitting device (16) and the light receiving device (18) are substantially linearly-aligned with the implement rotating device (14) and the implement (W, T, TWNI, TWI) such that upon activating the light emitting device (16), light (L) that is emitted by the light emitting device (16) is directed toward both of the implement (W, T, TWNi, TWi) and the light receiving device (18) whereby the light receiving device (18) captures an image corresponding to a portion (L2) of the light (L) emitted by the light emitting device (16) and a shadow (L1') formed by at least a portion of the implement (W, T, TWNI, TWI). The shadow (L1') corresponds to another portion (L1) of the light (L) that is not received by the light receiving device (18). The light receiving device (18) communicates the captured image to the computing resource (12) for determining uniformity or a lack of uniformity of the implement (W, T, TWNI, TWI). A method (100) for utilizing the system (10) is also disclosed. A computer program product is also disclosed.