| 摘要 |
PROBLEM TO BE SOLVED: To provide a transmission electron microscope, capable of making both observation in which a sample is placed in a magnetic field of an objective lens whose spherical aberration is corrected and Lorentz observation in which a sample is placed outside of the magnetic field of the objective lens whose spherical aberration is corrected available, and capable of enhancing spatial resolution of Lorentz observation.SOLUTION: In the transmission electron microscope equipped with a spherical aberration corrector, a first sample holder 106b is disposed at an upper stream side of a first objective lens 107, a deflector 105 is disposed at an upper stream side of a second objective lens 109, and a second sample holder 108b is disposed inside of the second objective lens. |
