| 摘要 |
PROBLEM TO BE SOLVED: To provide a terahertz emission microscope with which the accuracy of detecting terahertz electromagnetic waves is increased, and an optical system used in the terahertz emission microscope, and a method of manufacturing a device.SOLUTION: There is provided an optical system, including an extracting section and an ellipsoidal reflector surface. The refractive index of the extracting section is approximately the same as the refractive index of an observed object, the extracting section being optically coupled with the observed object to thereby extract a terahertz electromagnetic wave generated from the observed object. The ellipsoidal reflector surface has a first focal point and a second focal point, the observed object being to be arranged on the first focal point, a photoconductive device being on the second focal point, the photoconductive device being configured to detect the terahertz electromagnetic wave extracted by the extracting section, the ellipsoidal reflector surface guiding the extracted terahertz electromagnetic wave to the photoconductive device. |
