发明名称 HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER
摘要 Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.
申请公布号 US2014339419(A1) 申请公布日期 2014.11.20
申请号 US201214369912 申请日期 2012.12.04
申请人 DH Technologies Development Pte., Ltd. 发明人 Thomson Bruce;Haufler Robert E.
分类号 H01J49/06;H01J49/40;H01J49/00 主分类号 H01J49/06
代理机构 代理人
主权项 1. A mass spectrometer, comprising: an accelerator having an inlet aperture through which an ion beam can be directed; and a masking element disposed upstream from the accelerator and configured to selectively block at least a portion of the ion beam from entering the accelerator; wherein the portion of the ion beam is either a central portion of the ion beam or only one edge of the ion beam.
地址 Singapore SG