发明名称 |
TEMPERATURE DETECTING APPARATUS, SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A temperature detecting apparatus is provided which is capable of suppressing disconnection of a thermocouple wire or positional deviation of a thermocouple junction portion caused by change over time. The temperature detecting apparatus includes: an insulation rod installed to extend in a vertical direction and including a through-hole in vertical direction; a thermocouple wire inserted in the through-hole of the insulation rod, the thermocouple wire including a thermocouple junction portion at an upper end thereof and an angled portion at a lower end of the insulation rod; and a buffer area installed below the insulation rod and configured to suppress a restriction of a horizontal portion of the angled portion upon heat expansion, wherein an upper portion of the thermocouple wire or a middle portion in the vertical direction are supported by the insulation rod. |
申请公布号 |
US2014342474(A1) |
申请公布日期 |
2014.11.20 |
申请号 |
US201414446622 |
申请日期 |
2014.07.30 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
KOSUGI Tetsuya;UENO Masaaki;YAMAGUCHI Hideto |
分类号 |
H01L21/66;C23C16/02;G01K13/02 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
1. A temperature detecting unit comprising:
a vertically extending insulation rod installed in a protection member and having a through-hole therein extending in vertical direction; and a thermocouple wire inserted in the through-hole of the insulation rod, the thermocouple wire including a thermocouple junction portion protruding from an upper end of the insulation rod, an angled portion protruding from a lower end of the insulation rod and a horizontal portion disposed a rear end of the angled portion elongated in horizontal direction, wherein the horizontal portion is positioned higher than a lowermost end of the angled portion. |
地址 |
Tokyo JP |