发明名称 Method, measurement circuit and measuring device for measuring the dielectric properties of conductive media
摘要 The method involves determining unknown current and voltage parameters from a vector diagram. Parallel total capacitance (Cewp) is determined from the current and voltage parameters of the vector diagram. Periodical loss conductance is determined from the current and voltage parameters of the vector diagram. Real parts of a complex dielectric permittivity are determined from the parallel total capacitance and geometry of arrangement and electrodes. An imaginary part of the complex permittivity is determined from the parallel total capacitance and the periodical loss conductance. Independent claims are also included for the following: (1) a device for executing a method for measurement of dielectric properties of an electrical conductive substance (2) a computer program comprising a software code for executing a method for measurement of dielectric properties of an electrical conductive substance.
申请公布号 EP2555005(A3) 申请公布日期 2014.11.19
申请号 EP20120005226 申请日期 2012.07.17
申请人 SEDLMEYER, AXEL;SEDLMEYER, FELIX 发明人 SEDLMEYER, AXEL;SEDLMEYER, FELIX
分类号 G01R27/26;G01N27/02 主分类号 G01R27/26
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