| 摘要 |
A measuring device and related methods include, in at least one aspect, a method for controlling a measuring device: including processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate a first queue; instructing the measuring device to move at least one of one or more probes to each position listed in the first queue, and to take a surface touch measurement at each position; calculating a set of suitable edge touch positions based on the surface touch measurements, the set of suitable edge touch positions being used to generate a second queue of measurements; and instructing the measuring device to move the at least one of the one or more probes to each position listed in the second queue, and to take an edge measurement at each position. |
