发明名称 記憶装置およびその動作方法
摘要 <p>A memory unit includes memory elements and a drive section. In executing a first operation out of the first operation for changing resistance state of the memory element from one resistance state out of low resistance state and high resistance state to the other resistance state and a second operation for changing the resistance state of the memory element from the other resistance state to the one resistance state, the drive section performs stepwise operation, in which the drive section repeatedly performs, at least one time, a step in which strong stress application step for applying a stress for performing the first operation to the memory element as the drive target relatively strongly is performed and subsequently weak stress application step for applying a stress for performing the second operation to the memory element as the drive target relatively weakly is performed, and subsequently performs the strong stress application step.</p>
申请公布号 JP5626529(B2) 申请公布日期 2014.11.19
申请号 JP20110024575 申请日期 2011.02.08
申请人 发明人
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
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