| 摘要 |
A technical problem is to speed up the measurement processing of a three-dimensional shape. In order to solve the technical problem, a three-dimensional shape measuring apparatus 1 is configured so that an irradiating unit applies laser slit light while changing an irradiation position in an area under measurement, an imaging unit 16 images the reflected light of the laser slit light, a position detector 17d scans an image taken by the imaging unit to detect a laser position, and an imaging area changing unit 17b changes the position of the imaging area of the imaging unit 16 in accordance with the irradiation position of the laser slit light. |
