发明名称 半導体装置の製造方法
摘要 A method of manufacturing a MOSFET includes the steps of preparing a substrate with an epitaxial growth layer made of silicon carbide, performing ion implantation into the substrate with the epitaxial growth layer, forming a protective film made of silicon nitride on the substrate with the epitaxial growth layer into which the ion implantation was performed, and heating the substrate with the epitaxial growth layer on which the protective film was formed to a temperature range of 1600° C. or more in an atmosphere containing gas including a nitrogen atom.
申请公布号 JP5626037(B2) 申请公布日期 2014.11.19
申请号 JP20110050927 申请日期 2011.03.09
申请人 住友電気工業株式会社 发明人 増田 健良
分类号 H01L21/265;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/265
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