发明名称 マスクのデータ及び露光条件を決定するためのプログラム、決定方法、マスク製造方法、露光方法及びデバイス製造方法
摘要 A mask includes a main pattern for resolving a target pattern to be formed on a substrate and an auxiliary pattern not resolving. Values of parameters of the main pattern and the auxiliary pattern are set. An image is calculated that is formed when the main pattern and the auxiliary pattern determined by the values of the parameters of the main pattern and the auxiliary pattern are projected by a projection optical system. Based on a result of the calculation that is performed by modifying the values of the parameters of the main pattern and the auxiliary pattern, the values of the parameters of the main pattern and the auxiliary pattern are determined to generate data of the mask including the main pattern and the auxiliary pattern determined.
申请公布号 JP5627394(B2) 申请公布日期 2014.11.19
申请号 JP20100244368 申请日期 2010.10.29
申请人 キヤノン株式会社 发明人 石井 弘之;辻田 好一郎
分类号 G03F1/70;G03F1/68;G03F7/20;H01L21/027 主分类号 G03F1/70
代理机构 代理人
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