| 摘要 |
Provided is an X-ray inspection device, comprising: a pair of conveyor frames (71, 72) that is disposed symmetrically with respect to a center line (120a) as an axis along a substrate conveying direction, and clamps a printed substrate (W) in a substrate width direction; a substrate conveying mechanism that conveys in an X axis direction the printed substrate (W) supported by the conveyor frames (71, 72); and a distance adjustment mechanism (90) that drives the pair of conveyor frames (71, 72) so that the conveyor frames (71, 72) approach or depart from each other in the Y axis direction, thereby adjusting the width dimension of a printed substrate (W) that can be conveyed by the substrate conveying mechanism disposed on each of the conveyor frames (71, 72). |
