摘要 |
<p>A test tray for a test handler comprises a plurality of inserts to be mounted with a semiconductor device for testing, wherein the insert includes: a body to provide a space for the semiconductor device to be mounted; a printed circuit board provided on the lower part of the body to be disposed to face a connection terminal of the semiconductor device when the semiconductor device is mounted; an electrical connection unit electrically connected to the connection terminal thereof by contacting the connection terminal thereof on one surface of the PCB disposed to face the connection terminal thereof when the semiconductor device is mounted on the body, and electrically connected to a PCB wiring; and a connection rearrangement unit provided to cover the periphery of the electrical connection which aligns the connection terminal thereof and the electrical connection unit when the connection terminal thereof is connected to the electrical connection unit.</p> |