发明名称 半導体装置
摘要 A semiconductor device reduces the on-resistance and, at the same time, raises the breakdown voltage. The drain electrode 20 of the semiconductor device runs through cap layer 13 and electron supply layer 12 and gets to a position lower than two-dimensional electron gas layer 14 in channel layer 11. Thus, the drain electrode 20 directly contacts the channel layer 11, the electron supply layer 12 and the cap layer 13. Angles (acute angles)θ, ø andψare formed by the drain electrode 20 and the channel layer 11, the electron supply layer 12 and the cap layer 13 as viewed in the direction in which a hetero interface is formed (the transverse direction in FIG. 1) and relationships of ø<θand ø≰ψare established. In other words, ø is made smallest among the angles and the drain electrode 20 is remarkably tapered particularly at the position of the electron supply layer 12.
申请公布号 JP5625314(B2) 申请公布日期 2014.11.19
申请号 JP20090243369 申请日期 2009.10.22
申请人 发明人
分类号 H01L21/338;H01L29/41;H01L29/417;H01L29/778;H01L29/812 主分类号 H01L21/338
代理机构 代理人
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