发明名称 |
Graphite and/or graphene semiconductor devices |
摘要 |
Various embodiments are provided for graphite and/or graphene based semiconductor devices. In one embodiment, a semiconductor device includes a semiconductor layer and a semimetal stack. In another embodiment, the semiconductor device includes a semiconductor layer and a zero gap semiconductor layer. The semimetal stack/zero gap semiconductor layer is formed on the semiconductor layer, which forms a Schottky barrier. In another embodiment, a semiconductor device includes first and second semiconductor layers and a semimetal stack. In another embodiment, a semiconductor device includes first and second semiconductor layers and a zero gap semiconductor layer. The first semiconductor layer includes a first semiconducting material and the second semi conductor layer includes a second semiconducting material formed on the first semiconductor layer. The semimetal stack/zero gap semiconductor layer is formed on the second semiconductor layer, which forms a Schottky barrier. |
申请公布号 |
US8890277(B2) |
申请公布日期 |
2014.11.18 |
申请号 |
US201113577964 |
申请日期 |
2011.03.14 |
申请人 |
University of Florida Research Foundation Inc. |
发明人 |
Hebard Arthur Foster;Tongay Sefaattin |
分类号 |
H01L29/47;H01L29/812;H01L29/778;H01L29/872;H01L29/16;H01L29/20 |
主分类号 |
H01L29/47 |
代理机构 |
Thomas | Horstemeyer, LLP. |
代理人 |
Thomas | Horstemeyer, LLP. |
主权项 |
1. A Schottky diode comprising:
a semiconductor layer including a semiconducting material; a semimetal stack including a graphene layer, wherein the semimetal stack is formed on the semiconductor layer, and the semiconductor layer and the semimetal stack form a Schottky barrier; and an ohmic contact layer in contact with the semiconductor layer and not in contact with the semimetal stack. |
地址 |
Gainesville FL US |