发明名称 AC-driven high electron mobility transistor devices
摘要 A high performance high-electron mobility transistor (HEMT) design and methods of manufacturing the same are provided. This design introduces a bias layer in to the HEMT allowing the transistor to be fed with alternating current (AC) alone without the need for a negative direct current (DC) bias power supply.
申请公布号 US8890211(B1) 申请公布日期 2014.11.18
申请号 US201213725409 申请日期 2012.12.21
申请人 Lockheed Martin Corporation 发明人 Mayo Michael J.;Zinn Alfred A.;Heyns Roux M.
分类号 H01L29/739;H01L29/778;H01L29/66 主分类号 H01L29/739
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. A high electron mobility transistor (HEMT) comprising: a transport layer comprising a first material having a first bandgap; a barrier layer comprising a second material disposed directly on the transport layer, the second material having a second bandgap that is different from the first bandgap, wherein a bandgap difference between the first and second bandgaps results in a quantum well in a conduction band along an interface between the first and second materials; and a bias layer disposed under a portion of the transport layer and configured to be coupled to a first non-biased alternating current (AC) signal that allows operation of the HEMT without applying a direct current (DC) bias to a gate node of the HEMT.
地址 Bethesda MD US