发明名称 |
AC-driven high electron mobility transistor devices |
摘要 |
A high performance high-electron mobility transistor (HEMT) design and methods of manufacturing the same are provided. This design introduces a bias layer in to the HEMT allowing the transistor to be fed with alternating current (AC) alone without the need for a negative direct current (DC) bias power supply. |
申请公布号 |
US8890211(B1) |
申请公布日期 |
2014.11.18 |
申请号 |
US201213725409 |
申请日期 |
2012.12.21 |
申请人 |
Lockheed Martin Corporation |
发明人 |
Mayo Michael J.;Zinn Alfred A.;Heyns Roux M. |
分类号 |
H01L29/739;H01L29/778;H01L29/66 |
主分类号 |
H01L29/739 |
代理机构 |
McDermott Will & Emery LLP |
代理人 |
McDermott Will & Emery LLP |
主权项 |
1. A high electron mobility transistor (HEMT) comprising:
a transport layer comprising a first material having a first bandgap; a barrier layer comprising a second material disposed directly on the transport layer, the second material having a second bandgap that is different from the first bandgap, wherein a bandgap difference between the first and second bandgaps results in a quantum well in a conduction band along an interface between the first and second materials; and a bias layer disposed under a portion of the transport layer and configured to be coupled to a first non-biased alternating current (AC) signal that allows operation of the HEMT without applying a direct current (DC) bias to a gate node of the HEMT. |
地址 |
Bethesda MD US |