Driving circuit of a test access port

摘要

A driving circuit of a test access port is disclosed. The driving circuit includes an input terminal for receiving a first test data signal when the driving circuit is operating in an external test mode. The driving circuit is configured to receive a second test data signal (BS) carrying a test command to be executed on the test access port when the driving circuit is operating in an internal test mode. The driving circuit comprises a control logic circuit configured for processing the test command and generating therefrom an internal test data signal carrying the processed test command when the driving circuit is operating in the internal test mode. The driving circuit includes a selector configured for generating a selected test data signal, the selected test data signal being selected from the first test data signal when the driving circuit is operating in the external test mode.

主权项

1. A driving circuit for a test access port, the driving circuit comprising:
an input configured to receive a first test data signal in an external test mode; another input configured to receive a second test data signal carrying a test command to be executed on the test access port when in an internal test mode; a control logic circuit configured to process the test command and to generate therefrom an internal test data signal carrying a processed test command in the internal test mode; a selector configured to generate a selected test data signal from the first test data signal when in the external test mode, and from the internal test data signal when in the internal test mode; and a first output configured to output the selected test data signal.