发明名称 TESTING SUPPORT DEVICE AND TESTING SUPPORT METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a technique to support a tester on various settings for testing a management system for managing an operation of facilities.SOLUTION: A testing support device includes: a pattern data registration part for registering pattern data indicating setting contents of elements included in a testing setting procedure in a first database; a testing scenario creation part for creating a testing scenario indicating the testing setting procedure by one designated pattern data or a sequenced combination of a plurality of pattern data of the pattern data registered in the first database, and registering it in a second database; and a testing scenario reproduction part for acquiring the testing scenario and the pattern data included in the testing scenario from the first and second databases, and setting the setting contents of the elements indicated in the pattern data in both or one of the facilities and the information processing device according to the testing setting procedure indicated in the testing scenario.</p>
申请公布号 JP2014213625(A) 申请公布日期 2014.11.17
申请号 JP20130090067 申请日期 2013.04.23
申请人 HITACHI LTD 发明人 NISHIDA KOTARO;SATO NOBORU;SHIMURA AKITOSHI
分类号 B61L27/00;G06Q50/30 主分类号 B61L27/00
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