发明名称 LIGHT RAY PROPERTY MEASUREMENT DEVICE FOR LIGHT RAY DIRECTIVITY CONTROL SECTION, AND LIGHT RAY PROPERTY MEASUREMENT METHOD FOR LIGHT RAY DIRECTIVITY CONTROL SECTION
摘要 PROBLEM TO BE SOLVED: To evaluate an effectiveness of a light ray directivity control section of a light-emitting device without actually fabricating the light-emitting device.SOLUTION: A light ray property measurement device 1 comprises: an evaluation sample 10 including a transparent substrate 13 composed of the same material as a transparent dielectric layer 170 of a light-emitting device 110A, and light ray directivity control sections 11, 12 arranged on the transparent substrate 13 in an annular manner and having the same configuration as light ray directivity control sections 111, 112 of the light-emitting device 110A; a light source 20 irradiating an incidence surface 13a of the transparent substrate 13 with light; and a light detector 30 detecting a light ray emitted from the light ray directivity control sections 11, 12 of the evaluation sample 10 to measure the property. A distance D2 from bottom surfaces of the light ray directivity control sections 11, 12 of the evaluation sample 10 to the incidence surface 13a is equal to a distance D1 from bottom surfaces of the light ray directivity control sections 111, 112 of the light-emitting device 110A to a top face of a light-emitting section 120. The incidence surface 13a of the transparent substrate 13 included in the evaluation sample 10 serves as a diffusion surface.
申请公布号 JP2014215077(A) 申请公布日期 2014.11.17
申请号 JP20130090311 申请日期 2013.04.23
申请人 NIPPON HOSO KYOKAI <NHK> 发明人 SAITO NOBUO;HIRANO YOSHIKUNI;MOTOYAMA YASUSHI;TANAKA KATSU
分类号 G01M11/00;G01J1/00;G02B5/00;G03B35/24;H01L33/58;H04N5/225;H04N13/04 主分类号 G01M11/00
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