发明名称 SLURRY COMPOSITION AND SUBSTRATE POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a slurry composition used for chemical mechanical polishing (CMP) and a substrate polishing method.SOLUTION: The present invention relates to a slurry composition containing a polishing material and a water soluble polymer. The slurry composition contains a soluble polymer, which has a solubility parameter of 9.0-14.0 and contains a hetero atom, with an added amount that lowers a polishing rate in the vicinity of an edge part of a substrate to be polished to a level below an average polishing rate on the substrate to be polished, the edge part being defined as a region within 1 mm from the outermost edge of the substrate to be polished. The water soluble polymer may have an average molecular weight in the range from 200 to approximately 3 million, and when the water soluble polymer has an SP value of 9.5 or less and contains a hetero atom in a main chain structure, the water soluble polymer may have an average molecular weight in the range from 200 to 110,000.
申请公布号 JP2014216464(A) 申请公布日期 2014.11.17
申请号 JP20130092253 申请日期 2013.04.25
申请人 JAPAN CABOT MICROELECTRONICS CORP 发明人 MASUDA TAKESHI;KITAMURA HIROSHI;MATSUMURA YOSHIYUKI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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