发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, which can inhibit poor connection.SOLUTION: A semiconductor device of an embodiment comprises: a package substrate 21; a printed wiring board 11; a restriction pin 42 which pierces the printed wiring board 11 and the package substrate 21 to restrict deformation in a direction in which the printed wiring board 11 and the package substrate 21 separated from each other; a standoff 43 provided between the printed wiring board 11 and the package substrate 21 to restrict deformation in a direction in which the printed wiring board 11 and the package substrate 21 come closer to each other. The restriction pin 42 includes a head 42a which contacts a surface 14 of the printed wiring board 11 on the side separated from the package substrate 21, a hook part 42c which is openable and closable in a direction parallel with a surface 24 of the package substrate 21 on the side separated from the printed wiring board 11 and hooked into the surface 24, and a spring part 42b for connecting the head 42a and the hook part 42c.
申请公布号 JP2014216618(A) 申请公布日期 2014.11.17
申请号 JP20130095562 申请日期 2013.04.30
申请人 FUJITSU LTD 发明人 WATANABE MANABU;FUKUSONO KENJI;BABA SHUNJI
分类号 H01L21/60;H01L23/12;H05K1/18 主分类号 H01L21/60
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