发明名称 LIGHT SOURCE DEVICE, INSPECTION DEVICE, AND WAVELENGTH CONVERSION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a light source device, inspection device, and wavelength conversion method capable of generating DUV light with a simple configuration.SOLUTION: The light source device of one embodiment of the present invention includes: a first laser light source 11 for generating a first laser beam of a wavelength of 932-936 nm; a second laser light source 12 for generating a second laser beam of a wavelength of 1111-1130 nm; first wavelength converting means 20 for generating the fourth harmonic wave of the first laser beam; and second wavelength converting means 30 having a CLBO crystal 235 for generating DUV light of a wavelength of 193.2-193.6 nm by sum frequency mixing of the fourth harmonic wave and the second laser beam.</p>
申请公布号 JP2014215577(A) 申请公布日期 2014.11.17
申请号 JP20130095107 申请日期 2013.04.30
申请人 LASERTEC CORP;OXIDE CORP 发明人 SAKUMA JUN;KANEDA YUJI
分类号 G02F1/37;G01N21/956;H01S3/00;H01S3/109 主分类号 G02F1/37
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