发明名称 |
LIGHT SOURCE DEVICE, INSPECTION DEVICE, AND WAVELENGTH CONVERSION METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a light source device, inspection device, and wavelength conversion method capable of generating DUV light with a simple configuration.SOLUTION: The light source device of one embodiment of the present invention includes: a first laser light source 11 for generating a first laser beam of a wavelength of 932-936 nm; a second laser light source 12 for generating a second laser beam of a wavelength of 1111-1130 nm; first wavelength converting means 20 for generating the fourth harmonic wave of the first laser beam; and second wavelength converting means 30 having a CLBO crystal 235 for generating DUV light of a wavelength of 193.2-193.6 nm by sum frequency mixing of the fourth harmonic wave and the second laser beam.</p> |
申请公布号 |
JP2014215577(A) |
申请公布日期 |
2014.11.17 |
申请号 |
JP20130095107 |
申请日期 |
2013.04.30 |
申请人 |
LASERTEC CORP;OXIDE CORP |
发明人 |
SAKUMA JUN;KANEDA YUJI |
分类号 |
G02F1/37;G01N21/956;H01S3/00;H01S3/109 |
主分类号 |
G02F1/37 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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