发明名称 SQUARENESS MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a squareness measuring device capable of accurately measuring squareness of a measured object.SOLUTION: A squareness measuring device 1 for measuring squareness of a measured object W includes: a transparent substrate 12 having a placing surface where the measured object W is placed; a tool 13 having a first surface 19A orthogonal to the placing surface and a second surface 19B orthogonal to the placing surface and the first surface 19A, and fixed on the placing surface; and an illumination light source 10 for illuminating the substrate 12 from the surface side on the opposite side to the placing surface of the substrate 12.
申请公布号 JP2014215109(A) 申请公布日期 2014.11.17
申请号 JP20130091119 申请日期 2013.04.24
申请人 SUMITOMO CHEMICAL CO LTD 发明人 SHIRAISHI YUICHI
分类号 G01B5/245 主分类号 G01B5/245
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