发明名称 |
FIELD EFFECT SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
<p>PROBLEM TO BE SOLVED: To connect a contact plug and a metal source-drain electrode reliably, while suppressing junction leakage or increase in resistance.SOLUTION: A field effect semiconductor device having a metal S/D structure includes a semiconductor substrate 10, a gate electrode 13 formed on the substrate 10 via a gate insulating film 12, a source-drain electrode 20 formed on the surface of the substrate 10 across a channel region under the gate electrode 13 and composed of an alloy of a semiconductor composing the substrate 10 and a meal, and a contact plug 30 coming into contact with the source-drain electrode 20. The interface of the source-drain electrode 20 in a region 22 directly under the contact plug and the substrate 10 exists at a position deeper to the substrate side than the interface of the source-drain electrode 20 in other region 21 and the substrate 10.</p> |
申请公布号 |
JP2014216521(A) |
申请公布日期 |
2014.11.17 |
申请号 |
JP20130093579 |
申请日期 |
2013.04.26 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
IRISAWA HISASHI;TEZUKA TSUTOMU |
分类号 |
H01L21/336;H01L21/28;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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