发明名称 METHOD OF COMPENSATING FREQUENCY DRIFT IN AN INTERFEROMETER
摘要 A method of compensating for frequency drift of a reference energy source in an FT interferometer based spectrometer instrument, the method further comprising comparing in an arithmetic unit data representing a reference interferogram and data representing a target interferogram to determining a phase shift between the interferograms in a window W in at least one region away from center-burst and generating in the arithmetic unit a mathematical transform dependent on the determined shift or shifts to be subsequently applied to control the operation of the spectrometer instrument in order to generate data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.
申请公布号 US2014336972(A1) 申请公布日期 2014.11.13
申请号 US201114345471 申请日期 2011.10.17
申请人 Juhl Henrik Vilstrup 发明人 Juhl Henrik Vilstrup
分类号 G01J3/45 主分类号 G01J3/45
代理机构 代理人
主权项 1. A method of compensating for frequency drift of a reference energy source in a Fourier Transform (FT) interferometer based spectrometer instrument, the method comprising: obtaining, by an arithmetic unit of the spectrometer instrument, reference data representing a reference interferogram collected in response to a first trigger signal, the first trigger signal being generated based on an emission frequency of the reference energy source and based on a first position of a moving optical element of the interferometer; obtaining, by the arithmetic unit, target data representing a target interferogram recorded by the FT interferometer in response to a second trigger signal, the second trigger signal being generated based on the emission frequency of the reference energy source and based on second position of the moving optical element of the interferometer; comparing, by the arithmetic unit, the reference data and the target data to determine at least one phase shift between the reference interferogram and the target interferogram in at least one region away from a center-burst region of the reference interferogram and the target interferogram; generating, by the arithmetic unit, a mathematical transform based on the determined at least one phase shift; and applying the mathematical transform to control spectrometer instrument to generate stabilized data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.
地址 Roskilde DK