发明名称 CONTINUOUS PLASMA ETCH PROCESS
摘要 <p>Provided is a method for etching pitchers by using continuous plasma. The first plasma process is provided and includes a step of providing a flow of first process gas into a process chamber; a step of maintaining the continuous plasma; and a step of stopping the flow of the first process gas into the process chamber. A transition process is provided and includes a step of providing a flow of transition gas into the process chamber; a step of maintaining the continuous plasma; and a step of stopping the flow of the transition gas into the process chamber. A second plasma process is provided and includes a step of providing a flow of second process gas into the process chamber; a step of maintaining the continuous plasma; and a step of stopping the second process gas into the process chamber.</p>
申请公布号 KR20140131482(A) 申请公布日期 2014.11.13
申请号 KR20140052750 申请日期 2014.04.30
申请人 LAM RESEARCH CORPORATION 发明人 LEE, WON CHUL;FU QIAN
分类号 H01L21/3065 主分类号 H01L21/3065
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