发明名称 Apparatus and Method Relating to an Improved Mass Spectrometer
摘要 The present disclosure provides a mass spectrometer including means for producing a primary beam of ions for bombarding a sample under vacuum and a detector for detecting a secondary beam of ions released from the sample. The primary beam of ions includes a gaseous mixture of a cluster forming gas and one or more hydrogen-rich hydrocarbons.
申请公布号 US2014332679(A1) 申请公布日期 2014.11.13
申请号 US201414276147 申请日期 2014.05.13
申请人 IONOPTIKA LIMITED 发明人 Blenkinsopp Paul William Miles;Barber Andrew Mark
分类号 H01J49/10;H01J49/00 主分类号 H01J49/10
代理机构 代理人
主权项 1. A mass spectrometer comprising: means for producing a primary beam of ions for bombarding a sample under vacuum; and a detector for detecting a secondary beam of ions released from the sample; wherein the primary beam of ions includes a gaseous mixture of a cluster forming gas and one or more hydrogen-rich hydrocarbons.
地址 Hampshire GB