| 摘要 |
The invention relates to a method for automatic calibration of a device for generative production of a three-dimensional object (8), said method including the following steps: irradiating an applied layer of a material (3) or a target by means of a first scanner (14) in order to produce a first test pattern (33) in the material (3) or the target; irradiating the applied layer of the material (3) or the target by means of a second scanner (15) in order to produce a second test pattern (34) in the material (3) or the target; detecting the first and second test pattern (33, 34) by means of a camera (24) and assigning the first and second test pattern (33, 34) to the first and second scanner (14, 15) respectively; comparing the first and/or the second test pattern (33, 34) to a reference pattern and/or comparing the first and second test pattern (33, 34) to one another; determining a first deviation of the first test pattern (33) from the reference pattern and/or a second deviation of the second test pattern (34) from the reference pattern and/or a relative deviation between the first test pattern (33) and the second test pattern (34); and calibrating the first and/or the second scanner (14, 15) in such a manner that the first and/or the second deviation from the reference pattern and /or the relative deviation between the first test pattern (33) and the second test pattern (34) falls below an intended value. |
