发明名称 |
METHOD FOR FORMING FINE PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a fine pattern by which a resist pattern and an inorganic pattern with small LWR and good features are formed and a good pattern can be formed on a substrate to be processed.SOLUTION: The method for forming a fine pattern of the present invention includes steps of: (1) forming a resist film by applying a photoresist composition on the substrate to be processed; (2) exposing the resist film; (3) forming a negative resist pattern by developing the exposed resist film with a developing solution containing an organic solvent; (4) forming an inorganic layer to cover the resist pattern surface; (5) removing the inorganic layer except for a portion formed on a side wall of the resist pattern by etching back the inorganic layer; and (6) forming an inorganic pattern by removing the resist pattern. |
申请公布号 |
JP2014211541(A) |
申请公布日期 |
2014.11.13 |
申请号 |
JP20130087872 |
申请日期 |
2013.04.18 |
申请人 |
JSR CORP |
发明人 |
SHIMA MOTOYUKI;FURUKAWA TAIICHI |
分类号 |
G03F7/40;G03F7/038;G03F7/039;H01L21/027 |
主分类号 |
G03F7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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