发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a transistor excellent in electrical characteristics.SOLUTION: A semiconductor device manufacturing method comprises: preparing a substrate having an insulating surface; depositing laminated films including a first oxide semiconductor layer and a second oxide semiconductor layer on the substrate; forming a mask layer on a part of the laminated films and subsequently performing a dry etching treatment thereby to remove the laminated films leaving a region where the mask layer is provided and to form a reaction product on a lateral face of the remaining laminated films; removing the mask layer and subsequently removing the reaction product by a wet etching treatment to form a source electrode and a drain electrode on the laminated films; and forming a third oxide semiconductor layer, a gate insulation film, and a gate electrode by sequential lamination on the laminated films, on the source electrode and on the drain electrode. |
申请公布号 |
JP2014212312(A) |
申请公布日期 |
2014.11.13 |
申请号 |
JP20140075249 |
申请日期 |
2014.04.01 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KURATA MOTOMU;SASAGAWA SHINYA;MURAOKA TAIGA;HONDA HIROAKI;HAMADA TAKASHI |
分类号 |
H01L21/336;H01L21/28;H01L29/41;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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