发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a transistor excellent in electrical characteristics.SOLUTION: A semiconductor device manufacturing method comprises: preparing a substrate having an insulating surface; depositing laminated films including a first oxide semiconductor layer and a second oxide semiconductor layer on the substrate; forming a mask layer on a part of the laminated films and subsequently performing a dry etching treatment thereby to remove the laminated films leaving a region where the mask layer is provided and to form a reaction product on a lateral face of the remaining laminated films; removing the mask layer and subsequently removing the reaction product by a wet etching treatment to form a source electrode and a drain electrode on the laminated films; and forming a third oxide semiconductor layer, a gate insulation film, and a gate electrode by sequential lamination on the laminated films, on the source electrode and on the drain electrode.
申请公布号 JP2014212312(A) 申请公布日期 2014.11.13
申请号 JP20140075249 申请日期 2014.04.01
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KURATA MOTOMU;SASAGAWA SHINYA;MURAOKA TAIGA;HONDA HIROAKI;HAMADA TAKASHI
分类号 H01L21/336;H01L21/28;H01L29/41;H01L29/786 主分类号 H01L21/336
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