发明名称 |
METHOD AND APPARATUS FOR EXTRACTING DELAY PARAMETER |
摘要 |
A delay parameter extracting apparatus includes a schematic composing unit, a layout composing unit, a verification unit, and a parameter extracting unit. The schematic composing unit is configured to: facilitate design of a schematic circuit; and generate a first net list based on the design of the schematic circuit. The layout composing unit is configured to: facilitate design of a layout based on the schematic circuit; and generate a second net list based on the design of the layout. The verification unit is configured to verify the layout by comparing the first net list to the second net list. The parameter extracting unit is configured to: extract capacitance (C) values from the layout; and extract delay parameters based on the C values with respect to respective nets according to types of delay parameters associated with the respective nets. |
申请公布号 |
US2014337813(A1) |
申请公布日期 |
2014.11.13 |
申请号 |
US201314019108 |
申请日期 |
2013.09.05 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
YANG Seo-Hyeong |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
1. A delay parameter extracting apparatus, comprising:
a schematic composing unit configured to:
facilitate design of a schematic circuit; andgenerate a first net list based on the design of the schematic circuit; a layout composing unit configured to:
facilitate design of a layout based on the schematic circuit; andgenerate a second net list based on the design of the layout; a verification unit configured to verify the layout by comparing the first net list to the second net list; and a parameter extracting unit configured to:
extract capacitance (C) values from the layout; andextract delay parameters based on the C values with respect to respective nets according to types of delay parameters associated with the respective nets, wherein the parameter extracting unit comprises:
a critical value setting unit configured to:
set critical values for dividing the C values into sectors; anddetermine a first sector for extracting resistance-capacitance (RC) values, a second sector for extracting only C values, and a third sector for ignoring corresponding nets; andan RC extracting unit configured to:
extract RC values with respect to nets comprising C values corresponding to the first sector;extract only C values with respect to nets comprising C values corresponding to the second sector; andignore nets comprising C values corresponding to the third sector. |
地址 |
Yongin-city KR |