发明名称 |
MEASUREMENT DEVICE AND MEASUREMENT METHOD |
摘要 |
Light emitted from a low-coherence light source is split into two beams by an optical coupler. One of the beams is applied to a sample medium. The other beam is subjected to phase modulation by a reference minor and a vibration element. The (reference) beam subjected to phase modulation and a scattered beam from the sample medium are wavelength-resolved by a diffraction grating, and the spectrum of resulting interference light is detected by a photodetector. A calculation section calculates an intensity signal corresponding to the position of each scattering point in the sample medium based on the detected spectrum, calculates a power spectrum corresponding to the position of each scattering point based on a temporal change in the intensity signal corresponding to the position of each scattering point, and calculates a diffusion coefficient of the particles corresponding to the position of each scattering point based on the calculated power spectrum. |
申请公布号 |
US2014336990(A1) |
申请公布日期 |
2014.11.13 |
申请号 |
US201214360505 |
申请日期 |
2012.10.24 |
申请人 |
NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY |
发明人 |
Iwai Toshiaki;Watarai Toshiharu |
分类号 |
G01N15/14 |
主分类号 |
G01N15/14 |
代理机构 |
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代理人 |
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主权项 |
1. A measurement device that performs a dynamic light scattering measurement process to characterize particles suspended in a sample medium, the measurement device comprising:
an optical splitter section that splits light emitted from a low-coherence light source into two beams; an illumination section that applies one of the two beams split by the optical splitter section to the sample medium; a phase modulation section that modulates the other of the two beams split by the optical splitter section in phase; a spectrum acquisition section that resolves the beam subjected to the phase modulation and a scattered beam from the sample medium on a wavelength basis, and acquires a spectrum of interference light of the beam subjected to the phase modulation and the scattered beam; and a measurement section that performs the dynamic light scattering measurement process to characterize the particles on the basis of the acquired spectrum, the measurement section calculating an intensity signal corresponding to a position of each scattering point in the sample medium on the basis of the acquired spectrum, calculating a power spectrum corresponding to the position of each scattering point on the basis of a temporal variation of the intensity signal corresponding to the position of each scattering point, and calculating a diffusion coefficient of the particles corresponding to the position of each scattering point on the basis of the calculated power spectrum. |
地址 |
Fuchu-shi, Tokyo JP |