发明名称 MEASUREMENT DEVICE AND MEASUREMENT METHOD
摘要 Light emitted from a low-coherence light source is split into two beams by an optical coupler. One of the beams is applied to a sample medium. The other beam is subjected to phase modulation by a reference minor and a vibration element. The (reference) beam subjected to phase modulation and a scattered beam from the sample medium are wavelength-resolved by a diffraction grating, and the spectrum of resulting interference light is detected by a photodetector. A calculation section calculates an intensity signal corresponding to the position of each scattering point in the sample medium based on the detected spectrum, calculates a power spectrum corresponding to the position of each scattering point based on a temporal change in the intensity signal corresponding to the position of each scattering point, and calculates a diffusion coefficient of the particles corresponding to the position of each scattering point based on the calculated power spectrum.
申请公布号 US2014336990(A1) 申请公布日期 2014.11.13
申请号 US201214360505 申请日期 2012.10.24
申请人 NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY 发明人 Iwai Toshiaki;Watarai Toshiharu
分类号 G01N15/14 主分类号 G01N15/14
代理机构 代理人
主权项 1. A measurement device that performs a dynamic light scattering measurement process to characterize particles suspended in a sample medium, the measurement device comprising: an optical splitter section that splits light emitted from a low-coherence light source into two beams; an illumination section that applies one of the two beams split by the optical splitter section to the sample medium; a phase modulation section that modulates the other of the two beams split by the optical splitter section in phase; a spectrum acquisition section that resolves the beam subjected to the phase modulation and a scattered beam from the sample medium on a wavelength basis, and acquires a spectrum of interference light of the beam subjected to the phase modulation and the scattered beam; and a measurement section that performs the dynamic light scattering measurement process to characterize the particles on the basis of the acquired spectrum, the measurement section calculating an intensity signal corresponding to a position of each scattering point in the sample medium on the basis of the acquired spectrum, calculating a power spectrum corresponding to the position of each scattering point on the basis of a temporal variation of the intensity signal corresponding to the position of each scattering point, and calculating a diffusion coefficient of the particles corresponding to the position of each scattering point on the basis of the calculated power spectrum.
地址 Fuchu-shi, Tokyo JP
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