发明名称 HIGH ASPECT RATIO OPENINGS
摘要 A capacitor forming method includes forming an electrically conductive support material over a substrate, with the support material containing at least 25 at % carbon. The method includes forming an opening through at least the support material where the opening has an aspect ratio of at least 20:1 within a thickness of the support material. After forming the opening, the method includes processing the support material to effect a reduction in conductivity, and forming a capacitor structure in the opening.
申请公布号 US2014334064(A1) 申请公布日期 2014.11.13
申请号 US201414279592 申请日期 2014.05.16
申请人 Micron Technology, Inc. 发明人 Kiehlbauch Mark W.
分类号 H01G4/08 主分类号 H01G4/08
代理机构 代理人
主权项 1. A capacitor forming method comprising: forming an electrically conductive material over a substrate, the electrically conductive material containing at least 20 at % carbon; forming an opening in the electrically conductive material; and after forming the opening, processing the electrically conductive material to effect a reduction in conductivity.
地址 Boise ID US