发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A bottom-gate transistor with a short channel length and a method for manufacturing the transistor are provided. A bottom-gate transistor with a short channel length in which portions of a source electrode and a drain electrode which are proximate to a channel formation region are thinner than other portions thereof was devised. In addition, the portions of the source electrode and the drain electrode which are proximate to the channel formation region are formed in a later step than the other portions thereof, whereby a bottom-gate transistor with a short channel length can be manufactured.
申请公布号 US2014332801(A1) 申请公布日期 2014.11.13
申请号 US201414337583 申请日期 2014.07.22
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 SASAGAWA Shinya;SUZAWA Hideomi
分类号 H01L29/786;H01L29/423;H01L29/10;H01L29/24 主分类号 H01L29/786
代理机构 代理人
主权项 1. A semiconductor device comprising: a gate electrode layer; a gate insulating layer on one surface of the gate electrode layer; a semiconductor layer on one surface of the gate insulating layer; a first conductive layer over the semiconductor layer; a second conductive layer over the first conductive layer; a protective layer over the second conductive layer; and a hard mask layer over the protective layer, wherein the hard mask layer comprises an opening which overlaps with a channel formation region of the semiconductor layer.
地址 Atsugi-shi JP