发明名称 TERMINATION DESIGN FOR NANOTUBE MOSFET
摘要 A termination structure for a semiconductor power device includes a plurality of termination groups formed in a lightly doped epitaxial layer of a first conductivity type over a heavily doped semiconductor substrate of a second conductivity type. Each termination group includes a trench formed in the lightly doped epitaxial layer of the first conductivity type. All sidewalls of the trench are covered by a plurality of epitaxial layers of alternating conductivity types disposed on two opposite sides and substantially symmetrical with respect to a central gap-filler layer disposed between two innermost epitaxial layers of an innermost conductivity type as the first conductivity type.
申请公布号 US2014332919(A1) 申请公布日期 2014.11.13
申请号 US201414444953 申请日期 2014.07.28
申请人 Alpha and Omega Semiconductor Incorporated 发明人 Guan Lingpeng;Bobde Madhur;Yilmaz Hamza;Padmanabhan Karthik
分类号 H01L29/06;H01L21/02 主分类号 H01L29/06
代理机构 代理人
主权项 1. A termination structure enclosing an active device area of a semiconductor power device disposed on a semiconductor die, comprising: a plurality of termination groups formed in a lightly doped epitaxial layer of a first conductivity type over a heavily doped semiconductor substrate of a second conductivity type, wherein each termination group includes a trench formed in the lightly doped epitaxial layer of the first conductivity type, and wherein sidewalls of the trench are covered by a plurality of epitaxial layers of alternating conductivity types disposed on opposite sides and substantially symmetrical with respect to a central gap-filler layer disposed between two innermost epitaxial layers of an innermost conductivity type.
地址 Sunnyvale CA US