发明名称 |
TERMINATION DESIGN FOR NANOTUBE MOSFET |
摘要 |
A termination structure for a semiconductor power device includes a plurality of termination groups formed in a lightly doped epitaxial layer of a first conductivity type over a heavily doped semiconductor substrate of a second conductivity type. Each termination group includes a trench formed in the lightly doped epitaxial layer of the first conductivity type. All sidewalls of the trench are covered by a plurality of epitaxial layers of alternating conductivity types disposed on two opposite sides and substantially symmetrical with respect to a central gap-filler layer disposed between two innermost epitaxial layers of an innermost conductivity type as the first conductivity type. |
申请公布号 |
US2014332919(A1) |
申请公布日期 |
2014.11.13 |
申请号 |
US201414444953 |
申请日期 |
2014.07.28 |
申请人 |
Alpha and Omega Semiconductor Incorporated |
发明人 |
Guan Lingpeng;Bobde Madhur;Yilmaz Hamza;Padmanabhan Karthik |
分类号 |
H01L29/06;H01L21/02 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
1. A termination structure enclosing an active device area of a semiconductor power device disposed on a semiconductor die, comprising:
a plurality of termination groups formed in a lightly doped epitaxial layer of a first conductivity type over a heavily doped semiconductor substrate of a second conductivity type, wherein each termination group includes a trench formed in the lightly doped epitaxial layer of the first conductivity type, and wherein sidewalls of the trench are covered by a plurality of epitaxial layers of alternating conductivity types disposed on opposite sides and substantially symmetrical with respect to a central gap-filler layer disposed between two innermost epitaxial layers of an innermost conductivity type. |
地址 |
Sunnyvale CA US |