Method for preparing a sample for electron microscopic investigation, the sample carrier and transport carrier used

摘要

A specimen containing a substrate (10) is placed in a vacuum chamber (32) for its preparation. A protective coating (21) is applied to a carrier surface for the specimen, which, when under the protective coating, is separated from the substrate by an ion beam (19). Independent claims are also included for the following: (A) A transmission electron microscope specimen carrier; (B) and for a holder with two micro-mechanical tong elements; (C) and for a glass capillary vessel in tension.