发明名称 High-resistivity silicon carbide substrate for semiconductor devices with high breakdown voltage
摘要 A high-resistivity silicon carbide single crystal is disclosed that includes at least one compensated dopant having an electronic energy level far enough from an edge of the silicon carbide bandgap to avoid conductive behavior, while far enough from mid-gap towards the band edge to create a greater band offset than do mid-level states when the substrate is in contact with a doped silicon carbide epitaxial layer and when the net amount of the dopant present in the crystal is sufficient to pin the Fermi level at the dopant's electronic energy level. The silicon carbide crystal has a resistivity of at least 5000 ohms-centimeters at room temperature.
申请公布号 EP1386026(B1) 申请公布日期 2014.11.12
申请号 EP20020734253 申请日期 2002.05.08
申请人 CREE, INC. 发明人 MUELLER, STEPHAN
分类号 C30B29/36;C30B23/00;C30B25/00;H01L21/04;H01L21/338;H01L29/02;H01L29/16;H01L29/161;H01L29/24;H01L29/812 主分类号 C30B29/36
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