发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>Provided is a semiconductor device to improve the capacity and reliability of a capacitor by preventing damage to oxygen atoms in a dielectric layer using interface treatment technology between the dielectric layer and an electrode. The semiconductor device comprises a first conductor; an oxide dielectric layer formed on the first conductor; an interface layer which is formed on the oxide dielectric layer, has a first formation enthalpy, and supplies oxygen; and a second conductor which is formed on the interface layer to touch the interface layer and has a second formation enthalpy which is higher than the first formation enthalpy.</p>
申请公布号 KR20140131142(A) 申请公布日期 2014.11.12
申请号 KR20130050114 申请日期 2013.05.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, KI YEON;KIM, HYUN JUN;AHN, SE HYOUNG;PARK, YOUNG GEUN;IM, KI VIN
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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