SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要
<p>Provided is a semiconductor device to improve the capacity and reliability of a capacitor by preventing damage to oxygen atoms in a dielectric layer using interface treatment technology between the dielectric layer and an electrode. The semiconductor device comprises a first conductor; an oxide dielectric layer formed on the first conductor; an interface layer which is formed on the oxide dielectric layer, has a first formation enthalpy, and supplies oxygen; and a second conductor which is formed on the interface layer to touch the interface layer and has a second formation enthalpy which is higher than the first formation enthalpy.</p>
申请公布号
KR20140131142(A)
申请公布日期
2014.11.12
申请号
KR20130050114
申请日期
2013.05.03
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
PARK, KI YEON;KIM, HYUN JUN;AHN, SE HYOUNG;PARK, YOUNG GEUN;IM, KI VIN