发明名称 半導体装置及び電子機器
摘要 <p>The transistor suffers the variation caused in threshold voltage or mobility due to gathering of the factors of the variation in gate insulator film resulting from a difference in manufacture process or substrate used and of the variation in channel-region crystal state. The present invention provides an electric circuit having an arrangement such that both electrodes of a capacitance element can hold a gate-to-source voltage of a particular transistor. The invention provides an electric circuit having a function capable of setting a potential difference at between the both electrodes of the capacitance element by the use of a constant-current source.</p>
申请公布号 JP5622949(B2) 申请公布日期 2014.11.12
申请号 JP20140002086 申请日期 2014.01.09
申请人 发明人
分类号 H03F3/34 主分类号 H03F3/34
代理机构 代理人
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