发明名称 Phase change memory apparatus and fabrication method thereof
摘要 A phase change memory apparatus is provided that includes a first electrode that is longer than it is wide, the first electrode having a trench formed on an active region of a semiconductor substrate, a second electrode formed in a bottom portion of the trench, and a bottom electrode contact formed on the second electrode.
申请公布号 US8883590(B2) 申请公布日期 2014.11.11
申请号 US201213731522 申请日期 2012.12.31
申请人 SK Hynix Inc. 发明人 Lee Jang Uk
分类号 H01L21/8234;H01L27/24;H01L45/00 主分类号 H01L21/8234
代理机构 Ladas & Parry LLP 代理人 Ladas & Parry LLP
主权项 1. A method of manufacturing a phase change memory apparatus, comprising: forming a selective epitaxial growth layer on an active region of a semiconductor substrate; forming a trench in the selective epitaxial growth layer; forming an electrode having an opposite conductivity to the selective epitaxial growth layer in a portion of the trench in order to form a diode by the selective epitaxial growth layer and the electrode; and forming a contact hole in the selective epitaxial growth layer to expose a portion of the active region; forming an ionization layer on a side wall of the contact hole; and forming a word line contact within the contact hole forming an electrode contact on the electrode, wherein the electrode contact is formed on the electrode to a determined height within the trench.
地址 Gyeonggi-do KR
您可能感兴趣的专利