发明名称 |
Semiconductor devices including dual gate electrode structures and related methods |
摘要 |
A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the control gate structure may include a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region. Moreover, the first and second gate electrodes may be electrically isolated. Related devices, structures, methods of operation, and methods of fabrication are also discussed. |
申请公布号 |
US8884340(B2) |
申请公布日期 |
2014.11.11 |
申请号 |
US201113298644 |
申请日期 |
2011.11.17 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kim Ji-Young;Jin Gyo-Young;Hong Hyeong-Sun;Oh Yong-Chul;Hwang Yoo-Sang;Choi Sung-Kwan;Woo Dong-Soo;Chung Hyun-Woo |
分类号 |
H01L21/336;H01L29/772;G11C11/404;H01L27/108;H01L29/66;H01L29/78;G11C11/408;H01L29/417;H01L29/423;H01L21/8234 |
主分类号 |
H01L21/336 |
代理机构 |
Myers Bigel Sibley & Sajovec, P.A. |
代理人 |
Myers Bigel Sibley & Sajovec, P.A. |
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate including first and second spaced apart source/drain regions defining a channel region therebetween; a control gate structure on the channel region between the first and second spaced apart source/drain regions, wherein the control gate structure includes a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region, wherein the first and second gate electrodes are electrically isolated; a bit line coupled to the first source/drain region; and a memory storage element coupled to the second source/drain region. |
地址 |
KR |