发明名称 Semiconductor devices including dual gate electrode structures and related methods
摘要 A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the control gate structure may include a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region. Moreover, the first and second gate electrodes may be electrically isolated. Related devices, structures, methods of operation, and methods of fabrication are also discussed.
申请公布号 US8884340(B2) 申请公布日期 2014.11.11
申请号 US201113298644 申请日期 2011.11.17
申请人 Samsung Electronics Co., Ltd. 发明人 Kim Ji-Young;Jin Gyo-Young;Hong Hyeong-Sun;Oh Yong-Chul;Hwang Yoo-Sang;Choi Sung-Kwan;Woo Dong-Soo;Chung Hyun-Woo
分类号 H01L21/336;H01L29/772;G11C11/404;H01L27/108;H01L29/66;H01L29/78;G11C11/408;H01L29/417;H01L29/423;H01L21/8234 主分类号 H01L21/336
代理机构 Myers Bigel Sibley & Sajovec, P.A. 代理人 Myers Bigel Sibley & Sajovec, P.A.
主权项 1. A semiconductor device comprising: a semiconductor substrate including first and second spaced apart source/drain regions defining a channel region therebetween; a control gate structure on the channel region between the first and second spaced apart source/drain regions, wherein the control gate structure includes a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region, wherein the first and second gate electrodes are electrically isolated; a bit line coupled to the first source/drain region; and a memory storage element coupled to the second source/drain region.
地址 KR