发明名称 Algorithm and a method for characterizing surfaces with fractal nature
摘要 A computer implemented method for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, is carried out by applying an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface. The invention provides a comprehensive approach for identifying all parameters of the W-M function including the phases and the density of the frequencies that must greater than 1. This enables the infinite-resolution analytical representation of any surface or density array through the W-M fractal function.
申请公布号 US8884954(B2) 申请公布日期 2014.11.11
申请号 US201213507968 申请日期 2012.08.10
申请人 The United States of America, as represented by the Secretary of the Navy 发明人 Michopoulos John G.;Iliopoulos Athanasios
分类号 G06T17/00;G06T17/05 主分类号 G06T17/00
代理机构 US Naval Research Laboratory 代理人 US Naval Research Laboratory ;Legg L. George
主权项 1. A computer software product for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, the product comprising a non-transitory physical computer-readable medium including stored instructions that, when executed by a computer, cause the computer to apply an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface, and wherein the surface has an array of elevation or height measurements zije, i, j=1 . . . K over a square region of size L×L and the parameters are γ and φmn of the surface z(x, y) and the surface is represented by the complex Weierstrass-Mandelbrot (W-M) function W as:W⁡(x)=∑n=-∞∞⁢γ(D-2)⁢n⁡(1-ⅇⅈγn⁢x)⁢ⅇⅈϕn(1) where x is a real variable, and where a two dimensional profile obtained from the real part of Eq. 1 is:z⁡(x)=Re⁡[W⁡(x)]=∑n=-∞∞⁢γ(D-2)⁢n⁡[cos⁢⁢ϕn-cos⁡(γn⁢x+ϕn)].(2) and where D is the fractal dimension (1<D<2 for line profiles), φn, is a random phase that is used to prevent coincidence of different phases, n is the frequency index and γ is a parameter that controls the density of the frequencies, and wherein the instructions include applying a Singular Value Decomposition (SVD) algorithm to a refactoring of Eq. (1), thereby determining said parameters of the Weierstrass-Mandelbrot (W-M) function describing the surface originally given in terms of measured elevation data.
地址 Washington DC US