发明名称 |
Algorithm and a method for characterizing surfaces with fractal nature |
摘要 |
A computer implemented method for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, is carried out by applying an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface. The invention provides a comprehensive approach for identifying all parameters of the W-M function including the phases and the density of the frequencies that must greater than 1. This enables the infinite-resolution analytical representation of any surface or density array through the W-M fractal function. |
申请公布号 |
US8884954(B2) |
申请公布日期 |
2014.11.11 |
申请号 |
US201213507968 |
申请日期 |
2012.08.10 |
申请人 |
The United States of America, as represented by the Secretary of the Navy |
发明人 |
Michopoulos John G.;Iliopoulos Athanasios |
分类号 |
G06T17/00;G06T17/05 |
主分类号 |
G06T17/00 |
代理机构 |
US Naval Research Laboratory |
代理人 |
US Naval Research Laboratory ;Legg L. George |
主权项 |
1. A computer software product for directly determining parameters defining a Weierstrass-Mandelbrot (W-M) analytical representation of a rough surface scalar field with fractal character, embedded in a three dimensional space, utilizing pre-existing measured elevation data of a rough surface in the form of a discrete collection of data describing a scalar field at distinct spatial coordinates, the product comprising a non-transitory physical computer-readable medium including stored instructions that, when executed by a computer, cause the computer to apply an inverse algorithm to the elevation data to thereby determine the parameters that define the analytical and continuous W-M representation of the rough surface, and wherein the surface has an array of elevation or height measurements zije, i, j=1 . . . K over a square region of size L×L and the parameters are γ and φmn of the surface z(x, y) and the surface is represented by the complex Weierstrass-Mandelbrot (W-M) function W as:W(x)=∑n=-∞∞γ(D-2)n(1-ⅇⅈγnx)ⅇⅈϕn(1) where x is a real variable, and where a two dimensional profile obtained from the real part of Eq. 1 is:z(x)=Re[W(x)]=∑n=-∞∞γ(D-2)n[cosϕn-cos(γnx+ϕn)].(2) and where D is the fractal dimension (1<D<2 for line profiles), φn, is a random phase that is used to prevent coincidence of different phases, n is the frequency index and γ is a parameter that controls the density of the frequencies, and wherein the instructions include applying a Singular Value Decomposition (SVD) algorithm to a refactoring of Eq. (1), thereby determining said parameters of the Weierstrass-Mandelbrot (W-M) function describing the surface originally given in terms of measured elevation data. |
地址 |
Washington DC US |