发明名称 |
X-ray tomographic inspection system for the identification of specific target items |
摘要 |
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening. |
申请公布号 |
US8885794(B2) |
申请公布日期 |
2014.11.11 |
申请号 |
US201313870407 |
申请日期 |
2013.04.25 |
申请人 |
Rapiscan Systems, Inc. |
发明人 |
Morton Edward James |
分类号 |
G01N23/04;G01V5/00;H01J35/04;A61B6/00;A61B6/02;A61B6/03 |
主分类号 |
G01N23/04 |
代理机构 |
Novel IP |
代理人 |
Novel IP |
主权项 |
1. A system for generating a sinogram, comprising:
a plurality of X-ray source points arranged around a scanning region; a first set of detectors arranged to detect X-rays transmitted through the scanning region; a second set of detectors arranged to detect X rays scattered from the scanning region; and a processing system for receiving unattenuated X-ray beam intensity data from the plurality of X-ray source points, for receiving attenuated X-ray beam intensity data from the first set of detectors, and for generating said sinogram from a function of said unattenuated X-ray beam intensity data and attenuated X-ray beam intensity data, wherein said sinogram comprises data arranged in an array with a pixel number along one axis and a source angle, corresponding to one of said plurality of X-ray source points, along a second axis. |
地址 |
Torrance CA US |