发明名称 Sample testing system and transporting apparatus
摘要 A sample testing system comprising: a test unit for loading and testing a sample contained in the sample container accommodated in the rack; a rack storage for storing the rack accommodating the sample container from which the sample has been loaded into the test unit; and a transporting part, configured to transport the rack in a first direction and in a second direction that is a reverse direction of the first direction, for transporting the rack in the first direction to the rack storage and transporting the rack stored in the rack storage in the second direction to a sample loading position at which the sample is loaded from the rack into the test unit, is disclosed. A transporting apparatus is also disclosed.
申请公布号 US8883078(B2) 申请公布日期 2014.11.11
申请号 US200912645930 申请日期 2009.12.23
申请人 Sysmex Corporation 发明人 Hamada Yuichi;Fukuma Daigo
分类号 G01N35/04;G01N35/10;G01N35/02;G01N35/00 主分类号 G01N35/04
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A sample testing system comprising: a test unit for loading and testing a sample in a rack; first and second rack storages; a rack feeder for feeding a rack to a feed position; a transporting part, configured to transport the rack in a first direction and in a second direction that is a reverse direction of the first direction between the first and second rack storages along a single and straight transporting path comprising, the feed position where a rack is fed by the rack feeder,a standby position corresponding to the first rack storage,a transfer position different from the feed position, anda sample loading position corresponding to the test unit,wherein the first direction is a direction towards the transfer position from the feed position and the sample loading position is located between the standby position and the feed position along the transporting path, wherein the first rack storage extends along the longitudinal axis of the transporting path past the transfer position in the first direction and comprises a length and width that allows the first rack storage to retain a single rack; a rack transfer part for transferring the rack present on the transfer position in a perpendicular direction with respect to the second direction to the second rack storage; and a controller including a memory under control of a processor, the memory storing instructions that, when executed, cause the processor to control the transporting part to hold a rack in the standby position until testing result of sample in the rack is obtained;control the transporting part to transport the rack in the second direction to return it from the standby position to the sample loading position or to the transfer position, according to the testing result, after obtaining the testing result.
地址 Kobe JP