发明名称 Masking circuit removing unknown bit from cell in scan chain
摘要 Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.
申请公布号 US8887018(B2) 申请公布日期 2014.11.11
申请号 US201012904303 申请日期 2010.10.14
申请人 Texas Instruments Incorporated 发明人 Narayanan Prakash;Jain Arvind;Subramanian Sundarrajan;Parekhji Rubin A.
分类号 G06F11/00;G01R31/3185 主分类号 G06F11/00
代理机构 代理人 Bassuk Lawrence J.;Telecky, Jr. Frederick J.
主权项 1. Electronic scan circuitry comprising: a decompressor; a plurality of scan chains fed by the decompressor; a scan circuit coupled to the plurality of scan chains to scan them in and out; a masking circuit fed by the scan chains; a scannable masking qualification circuit coupled to the masking circuit, the masking qualification circuit scannable by scan-in of scan chain cell qualifying bits by the decompressor along with scan-in of the scan chains, and the scannable masking qualification circuit operable to hold such scanned-in scan chain cell qualifying bits upon scan-out of the scan chains through the masking circuit; and the masking circuit is, in response to the scan chain cell qualifying bits, for removing an unknown bit from a single cell in a single scan chain in the plurality of scan chains.
地址 Dallas TX US