发明名称 Low cost error-based program testing apparatus and method
摘要 A low cost error-based program testing apparatus and method are provided. The testing apparatus according to an embodiment of the present invention generates error programs by adding errors to a test target program, selects a test target error program associated with test data among the error programs using error information obtained through the error addition, receives the test data to execute the test target error program, and tests for presence/absence of the errors. Accordingly, it is possible to reduce a text execution time and testing costs.
申请公布号 US8886999(B2) 申请公布日期 2014.11.11
申请号 US201213550118 申请日期 2012.07.16
申请人 Electronics and Telecommunications Research Institute 发明人 Ma Yu-Seung;Kim Seon-Tae
分类号 G06F11/00;G06F11/263 主分类号 G06F11/00
代理机构 Staas & Halsey LLP 代理人 Staas & Halsey LLP
主权项 1. An error-based program testing apparatus, comprising: an error program generation unit that generates error programs by adding errors to a test target program; a preprocessing unit that selects a test target error program associated with test data among the generated error programs using error information obtained through the addition of the errors; and an error program testing unit that receives the test data and executes the test target error program to thereby test for presence/absence of the errors, wherein the preprocessing unit comprises: a position information reading unit that reads position information of the error programs, the test data, and error codes included in the error programs; and an execution path analysis unit that ascertains an execution path by executing the test target program for each set of test data, detects an error program that has an error code positioned on the ascertained execution path, and excludes an error program that is not detected from the test target passed through the error program testing unit.
地址 Daejeon KR