ORGANIC LIGHT-EMITTING DISPLAY DEVICE AND MEASURING METHOD OF TRANSISTOR CHARACTERISTICS OF THE SAME

摘要

A method for measuring transistor characteristics of an organic light emitting device driven with two or more sensing horizontal sections defined by a scan signal of an embodiment comprises the steps of: applying a data voltage to a gate electrode of a driving transistor and applying a reference voltage to a source electrode of the driving transistor; sampling rising voltage applied to a reference line by a current flowing in the driving transistor with a sensing voltage; and drawing a threshold voltage of the driving transistor with the sensing voltage, wherein the sensing voltage is measured in two or more sensing horizontal sections respectively.