发明名称 |
APPARATUS FOR TESTING LED COMPONENT |
摘要 |
<p>A light emitting diode (LED) component testing apparatus according to the present invention tests reliability of an LED component and comprises: a body member which constitutes a body of a test chamber and houses components; the test chamber provided in the body member; a door member arranged in front of the test chamber; a heat supply plate member which is arranged on an opposite side with respect to the door member in the test chamber and constitutes one wall surface of the test chamber; a conductive plate member which is arranged on the heat supply plate member and where the LED component is mounted; a heating member which heats a working fluid supplied to the heat supply plate member; and a cooling member which cools down the working fluid supplied to the heat supply plate member, wherein a working fluid supply path is formed in the heat supply plate member. According to the invention, a surface, on which the LED component is mounted, and a space portion over the surface can be maintained at a temperature within a predetermined range.</p> |
申请公布号 |
KR20140130249(A) |
申请公布日期 |
2014.11.10 |
申请号 |
KR20130047285 |
申请日期 |
2013.04.29 |
申请人 |
YEST CO., LTD. |
发明人 |
SHU, MIN SUKE;BAIK, TAE HYUN;HAM, YOUNG JOON;KIM, NAM WON;LIM, EUN KYU;KANG, HA RA;PARK, JI YUP;HWANG, KWANG TAE |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|