发明名称 APPARATUS FOR TESTING LED COMPONENT
摘要 <p>A light emitting diode (LED) component testing apparatus according to the present invention tests reliability of an LED component and comprises: a body member which constitutes a body of a test chamber and houses components; the test chamber provided in the body member; a door member arranged in front of the test chamber; a heat supply plate member which is arranged on an opposite side with respect to the door member in the test chamber and constitutes one wall surface of the test chamber; a conductive plate member which is arranged on the heat supply plate member and where the LED component is mounted; a heating member which heats a working fluid supplied to the heat supply plate member; and a cooling member which cools down the working fluid supplied to the heat supply plate member, wherein a working fluid supply path is formed in the heat supply plate member. According to the invention, a surface, on which the LED component is mounted, and a space portion over the surface can be maintained at a temperature within a predetermined range.</p>
申请公布号 KR20140130249(A) 申请公布日期 2014.11.10
申请号 KR20130047285 申请日期 2013.04.29
申请人 YEST CO., LTD. 发明人 SHU, MIN SUKE;BAIK, TAE HYUN;HAM, YOUNG JOON;KIM, NAM WON;LIM, EUN KYU;KANG, HA RA;PARK, JI YUP;HWANG, KWANG TAE
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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