SEPARATABLE CONTACTOR FOR PROBE CARD

摘要

The present invention relates to a contactor for a probe card. A separable contactor for a probe card according to the present invention comprises: bumps in a matrix arrangement which are formed on one surface of a wafer in contact with a wafer pad to be tested; first connection pads which are electrically connected to the bumps, respectively, and arranged in one row outside the bumps; and second connection pads which have a pitch greater than that of each of the pads constituting the first connection pads, and are arranged in one row outside the first connection pads.