发明名称 |
DEVICE FOR ANALISING A RADIATING MATERIAL USING A MICROPROBE |
摘要 |
The invention relates to an analysis device comprising a main enclosure fitted with a secondary enclosure, a microprobe placed inside the main enclosure and fitted with an airlock and with a motion object, and a movable sample support that is movable from the secondary enclosure to the airlock and from the airlock to the motion object. Each of the airlock and the motion object includes a respective guide member for guiding the movable sample support and a respective sensor for detecting the presence of the movable sample support. |
申请公布号 |
US2014326880(A1) |
申请公布日期 |
2014.11.06 |
申请号 |
US201214356332 |
申请日期 |
2012.11.15 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
发明人 |
Lamontagne Jérôme;Blay Thierry;Benard Philippe |
分类号 |
G01N23/22;G01N23/225 |
主分类号 |
G01N23/22 |
代理机构 |
|
代理人 |
|
主权项 |
1. A device (10) for analyzing a material with the help of a microprobe (14), the device being characterized in that it comprises:
a main enclosure (11) containing a secondary enclosure (15); a microprobe (14) placed in the main enclosure and fitted with a motion object (20, 22); an airlock (26) placed in the main enclosure and connected to the microprobe and to the secondary enclosure; and a moveable sample support (28) movable from the secondary enclosure to the airlock and from the airlock to the motion object; and in that each of the airlock and the motion object includes a respective member (57, 59) for guiding the movable sample support to guide the support while it is being moved, and also a respective sensor (60) for detecting the presence of the movable sample support. |
地址 |
Paris FR |